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<front>
<journal-meta>
<journal-id journal-id-type="publisher-id">IJMC</journal-id>
<journal-title-group><journal-title>International Journal of Microelectronics and Circuits</journal-title></journal-title-group>
<publisher><publisher-name>Thomson &amp; Ryberg Publications</publisher-name></publisher>
</journal-meta>
<article-meta>
<article-id pub-id-type="doi">10.62715/ijmc.2026.v1.i1.pp25-30</article-id>
<article-id pub-id-type="publisher-id">0d2db719d5</article-id>
<article-categories><subj-group subj-group-type="heading"><subject>Perspective</subject></subj-group></article-categories>
<title-group><article-title>Chiplets and Advanced Packaging Will Change How Analog Designers Think About Interfaces</article-title></title-group>
<contrib-group>
<contrib contrib-type="author" corresp="yes"><name><surname>Martirosyan</surname><given-names>Zoe</given-names></name><xref ref-type="aff" rid="aff1"><sup>1</sup></xref><xref ref-type="corresp" rid="cor1">*</xref></contrib>
<contrib contrib-type="author"><name><surname>Nwosu</surname><given-names>Hirut</given-names></name><xref ref-type="aff" rid="aff2"><sup>2</sup></xref></contrib>
<contrib contrib-type="author"><name><surname>Nasser</surname><given-names>Chidi</given-names></name><xref ref-type="aff" rid="aff3"><sup>3</sup></xref></contrib>
<aff id="aff1"><label>1</label>Department of Electrical Electronics, Tamiraparani Academy of Electrical Electronics, India</aff>
<aff id="aff2"><label>2</label>Department of Electrical Electronics, Zambezi Research Institute of Electrical Electronics, Greece</aff>
<aff id="aff3"><label>3</label>Department of Electrical Electronics, Periyar Center for Electrical Electronics, Colombia</aff>
</contrib-group>
<author-notes><corresp id="cor1">* Correspondence: <email>zoe.martirosyan@tamiraparani.edu</email></corresp></author-notes>
<pub-date pub-type="epub" iso-8601-date="2026-08-16"><day>16</day><month>08</month><year>2026</year></pub-date>
<volume>1</volume>
<issue>1</issue>
<fpage>25</fpage>
<lpage>30</lpage>
<history>
<date date-type="received" iso-8601-date="2026-04-05"><day>05</day><month>04</month><year>2026</year></date>
<date date-type="accepted" iso-8601-date="2026-06-05"><day>05</day><month>06</month><year>2026</year></date>
</history>
<permissions><copyright-statement>© 2026 The Author(s)</copyright-statement><copyright-year>2026</copyright-year><license license-type="open-access" xlink:href="https://creativecommons.org/licenses/by/4.0/"><license-p>This is an open access article distributed under the Creative Commons Attribution 4.0 International License (CC BY 4.0).</license-p></license></permissions>
<self-uri xlink:href="https://trpub.org/article.php?id=0d2db719d5"/>
<abstract><p>For most of the history of integrated circuits an analogue designer&#x27;s interface was a pad: a place where the chip met a bond wire, a package lead and a board trace, and where electrostatic discharge protection, pad capacitance and a long interconnect set the terms. Chiplet-based systems assembled on silicon interposers, embedded bridges and stacked dies are moving many of those interfaces inside the package, where the connection is a microbump or a bonded copper pad and the wire is very short. This perspective argues that the change is more than a matter of scale. It alters what an interface circuit must drive, what it must survive, where its power comes from and which process it is built in, and it turns partitioning into an analogue design decision. The article sets out that argument, considers the objections that standard die-to-die interfaces hide the analogue content, that economics confine chiplets to a few products, and that test and thermal problems will hold the approach back, and draws implications for designers, for design tools and for the teaching of analogue circuits. It offers an argued view and reports no new data.</p></abstract>
<kwd-group kwd-group-type="author">
<kwd>Chiplets</kwd>
<kwd>Advanced packaging</kwd>
<kwd>Heterogeneous integration</kwd>
<kwd>Die-to-die interface</kwd>
<kwd>Analogue circuit design</kwd>
<kwd>Electrostatic discharge protection</kwd>
</kwd-group>
</article-meta>
</front>
<body>
<sec id="sec1"><title>1. Introduction</title>
<p>Gordon Moore&#x27;s 1965 article is remembered for its forecast of component counts, but it also observed that large systems might in the end be built more economically from smaller functions that are separately packaged and interconnected (Moore, 1965). Sixty years on, that remark describes a main line of development. Server processors are assembled from several dies on one substrate (Naffziger et al., 2021), silicon bridges embedded in organic packages connect dies at fine pitch (Mahajan et al., 2016), and logic dies are stacked face to face (Ingerly et al., 2019). Surveys of the field now list a wide range of fan-out, interposer and three-dimensional technologies (Lau, 2022).</p>
<p>Discussion of chiplets has concentrated on digital economics: yield of smaller dies, reuse of intellectual property, and mixing of process nodes (Iyer, 2016). The view taken here is that the change bears at least as heavily on analogue and mixed-signal design, and in a specific way. It relocates the interface. Circuits that used to sit at the edge of a chip and face the outside world now face another die a short distance away, and circuits that used to be buried in the middle of a system-on-chip find themselves at a die boundary. The argument is that this relocation changes the questions an analogue designer asks, and that the profession and its teaching should adjust.</p>
</sec>
<sec id="sec2"><title>2. The Interface Has Moved Inside the Package</title>
<p>Figure 1 sets out the levels at which a signal may now cross from one die to another or to the outside. Each level has its own geometry, parasitics and discharge environment, and a single product can use all of them. Five consequences follow for the circuits at the boundary.</p>
<fig id="fig1"><label>Figure 1</label><caption><p>Levels at which a signal can cross a die boundary, from the shortest reach inside the package to the board</p></caption><graphic xlink:href="IJMC_V1I1_2026_05_Figure1.png" mimetype="image" mime-subtype="png"/></fig>
<sec id="sec2-2"><title>2.1. A short link is a different circuit problem</title>
<p>A conventional chip-to-chip link is designed around a channel that is long compared with the wavelength of the signals on it. It needs matched terminations, equalisation and clock recovery, and the textbook treatment of signalling is largely about such channels (Dally and Poulton, 1998). A connection across an interposer or bridge is short, has low capacitance and modest loss, and can often be treated as a lumped load. The die-to-die standards exploit this: the Advanced Interface Bus (Kehlet, 2017) and Universal Chiplet Interconnect Express (Das Sharma et al., 2022) use many parallel lanes with a forwarded clock in place of a few heavily equalised serial lanes. The analogue effort shifts from equalising a hostile channel to minimising energy per bit, managing crosstalk among densely packed bumps, and aligning data with clock across hundreds of wires.</p>
<p>The same reasoning extends further. At the finest pitches, with dies bonded face to face, the number of connections is large enough that a bus need not be serialised at all, and the interface approaches the density of on-chip wiring. The circuit at each end is then closer to a simple buffer than to a transceiver, and what remains analogue is the distribution of timing and the control of supply noise across the bonded boundary.</p>
</sec>
<sec id="sec2-3"><title>2.2. Protection and loading are renegotiated</title>
<p>An external pad must survive handling by people and machines, and its protection devices add capacitance that every high-speed or high-impedance interface has had to design around (Voldman, 2015). A bump that is joined to another die during assembly and never touched afterwards faces a milder environment, dominated by charged-device events in the assembly process, and can carry much smaller protection. Less protection means less capacitance and leakage at the node. For an analogue designer that is an opening: a sensor readout, a data converter input or a reference line that crosses between dies inside a package can be designed with parasitics closer to those of an on-chip node than of a pin. It is also a risk to be specified with care, since the tolerable discharge level depends on a controlled assembly flow.</p>
</sec>
<sec id="sec2-4"><title>2.3. Power crosses the boundary too</title>
<p>Supplies and references are interfaces as much as signals are. In a stacked or interposer-based assembly, supply current reaches a die through through-silicon vias, microbumps and the redistribution layers of another die or of the interposer, and each adds resistance and inductance that must be modelled (Swaminathan and Engin, 2007). Sensitive analogue circuits may share those paths with digital loads that switch large currents. One response is to regulate close to the load: integrated voltage regulators with inductors built into the package have been in production for some years (Burton et al., 2014), and a package with several dies invites dedicated power-management chiplets. Decoupling capacitance can be placed in the interposer. The supply seen by the analogue designer is then no longer a pin with a datasheet tolerance but a network designed together with the package.</p>
</sec>
<sec id="sec2-5"><title>2.4. Clocks and references need a common ground</title>
<p>A clock or a voltage reference that crosses between dies is an analogue signal whatever the data beside it may be. Each crossing adds a buffer, a bump and a length of wire, and each of these adds jitter or noise that a converter or a radio on the receiving die will see directly. Two dies also have separate substrates and separate ground networks joined through the package, so a reference generated on one die is not automatically meaningful on the other. Designers of multi-die systems therefore have to decide which die owns each reference, whether to send it as a current or as a differential voltage, and how the return path is defined, questions that seldom arose when everything shared one substrate.</p>
</sec>
<sec id="sec2-6"><title>2.5. Partitioning becomes an analogue decision</title>
<p>When a system was a single die, the process was chosen for the digital logic and the analogue circuits made do. A package of several dies removes that constraint. Data converters, radio-frequency front ends, power stages and high-voltage drivers can stay on a node whose devices suit them, with thick-oxide transistors, good passives and mature models, while logic moves to the finest node. The saving in redesign at each logic node is considerable. The cost is that a boundary which was once a short on-chip wire becomes a die-to-die interface, and where to draw it is a question about signals: which nodes can tolerate the added capacitance and latency of a crossing, which need a shared reference, which clocks must cross with low jitter.</p>
<p>Table 1 summarises how several kinds of interface change when they move from the board into the package. Drawing the partition through a digital bus is easy and is what the standards provide for. Drawing it through an analogue signal path, between a sensor array and its readout or between a radio front end and its converter, may give a better system, and it requires analogue interface design of a kind that has few established conventions.</p>
<table-wrap id="tbl1"><label>Table 1</label><caption><p>How common interfaces change when they move from the board to the inside of a multi-die package</p></caption><table frame="hsides" rules="groups"><thead><tr><th>Interface</th><th>On a board</th><th>Inside the package</th><th>New analogue concern</th></tr></thead><tbody><tr><td>High-speed data</td><td>Few lanes, equalised, clock recovered</td><td>Many parallel lanes, forwarded clock Das Sharma et al., 2022</td><td>Skew, crosstalk, energy per bit</td></tr><tr><td>Discharge protection</td><td>Sized for handling of pins</td><td>Reduced for exposure during assembly only</td><td>Specifying and verifying the lower level</td></tr><tr><td>Supply</td><td>Regulated on the board, pin tolerance</td><td>Delivered through other dies or an interposer</td><td>Shared impedance, local regulation</td></tr><tr><td>Clock and reference</td><td>Crystal and board routing</td><td>Forwarded or distributed across dies</td><td>Jitter and noise added at each crossing</td></tr><tr><td>Analogue signal path</td><td>Buffered to drive pin and trace</td><td>Short crossing of low capacitance</td><td>No standard; co-design for each die pair</td></tr><tr><td>Test access</td><td>Probe pads and pins</td><td>Many bumps unreachable after assembly Marinissen and Zorian, 2009</td><td>Built-in test of analogue links</td></tr></tbody></table></table-wrap>
</sec>
</sec>
<sec id="sec3"><title>3. Counter-Arguments</title>
<p>The first objection is that standards make all this invisible. A designer who instantiates a standard die-to-die physical layer need know no more about it than about a memory compiler. That is true for the digital bus and is the point of standardisation. But someone designs the physical layer, and its transmitters, receivers, clock distribution and calibration loops are analogue circuits with new constraints. More to the point, the standards cover digital data. Supplies, references, clocks of high purity and analogue signal paths are outside them, and those are the crossings where analogue judgement is needed.</p>
<p>The second objection is economic. Analyses of chiplet cost show that the advantage depends on die size, volume and packaging cost, and that for many products a single die remains cheaper (Stow et al., 2017; Loh et al., 2021). Advanced packaging may therefore stay confined to large processors and accelerators, far from the consumer and industrial products where most analogue designers work. The objection has force for the present. It weakens to the extent that packaging capacity grows and that assemblies of mature-node dies on simpler substrates, which do not need the finest pitch, become ordinary.</p>
<p>The third objection concerns test, heat and mechanics. A die must be known to be good before it is committed to an expensive assembly, yet fine-pitch bumps are hard to probe and analogue performance is hard to guarantee from a wafer-level test; once assembled, internal interfaces are no longer reachable from outside (Marinissen and Zorian, 2009). A standard for test access in stacked dies exists (IEEE, 2020) but addresses digital access. Stacked and closely placed dies heat one another and are stressed mechanically by mismatched thermal expansion, which shifts the parameters of precision analogue circuits; such challenges have been recognised since the early work on three-dimensional integration (Knickerbocker et al., 2008). These are real obstacles. They are also, in large part, analogue and mixed-signal problems, and so they support the claim that the field is being drawn into packaging more than they refute it.</p>
</sec>
<sec id="sec4"><title>4. Implications for Designers, Tools and Teaching</title>
<p>For practising designers the first implication is that the package model belongs in the schematic from the start. Bump maps, interposer routing and the power network of neighbouring dies determine the load, the coupling and the supply seen by an interface circuit, and treating them as a late extraction step repeats, at higher cost, the mistake of ignoring layout parasitics on chip. The second is that specifications must be written for the die as a component of an assembly: discharge levels for internal bumps, noise allowed on a shared reference, the thermal environment created by a neighbour. The Heterogeneous Integration Roadmap treats such co-design as a central need (IEEE EPS, 2019).</p>
<p>For tools the implication is that the boundaries between chip, package and board simulation have to become thinner. Analogue verification today assumes one process design kit and one extracted netlist. An assembly has several kits, an interposer or substrate technology with its own extraction, and electromagnetic, thermal and mechanical interactions between them. Flows that can hold all of this for a digital timing check are appearing. Flows that let an analogue designer simulate a signal path across three dies with trustworthy parasitics and a consistent treatment of supply and substrate are less mature.</p>
<p>For teaching the implication is modest in content and significant in emphasis. Students of analogue design learn the pad, the bond wire and the fifty-ohm line as the facts of life at the chip boundary. They should also meet the microbump, the through-silicon via and the lumped short link, learn how protection requirements depend on where an interface sits, and practise partitioning a mixed-signal system across dies as a design exercise with electrical consequences. None of this displaces device physics or feedback theory. It changes the examples.</p>
<p>There is an organisational implication as well. Package design has usually been the work of a separate team that receives a bump map late in the project. If the interposer carries analogue signals, references and supplies whose quality decides whether a converter meets its specification, the package engineer and the circuit designer need a shared model and an agreed budget from the first floorplan, much as layout and circuit design had to be brought together when parasitics began to dominate on chip.</p>
</sec>
<sec id="sec5"><title>5. Conclusion</title>
<p>Chiplets and advanced packaging are usually presented as a digital cost story. The position taken here is that they move the analogue designer&#x27;s interface from the edge of the package to its interior, and that this alters the load, the protection, the supply and the choice of process in ways that reward deliberate design. The objections from standardisation, economics and test limit how fast and how widely the change will be felt, but each points back to analogue questions that someone must answer. Designers who learn to think of the package as part of the circuit will be better placed than those who wait for the interface to be defined for them.</p>
</sec>
<sec id="sec6"><title>Conflict of interest</title>
<p>To be declared by the author(s) before publication.</p>
</sec>
<sec id="sec7"><title>Funding</title>
<p>To be declared by the author(s) before publication.</p>
</sec>
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<ref-list><title>References</title>
<ref id="ref1"><label>1</label><mixed-citation publication-type="other"><person-group person-group-type="author"><string-name>Burton, E.A., Schrom, G., Paillet, F., Douglas, J., Lambert, W.J., Radhakrishnan, K. and Hill, M.J.</string-name></person-group> (<year>2014</year>). <article-title>FIVR: Fully integrated voltage regulators on 4th generation Intel Core SoCs</article-title>. <source>2014 IEEE Applied Power Electronics Conference and Exposition (APEC)</source>, <fpage>432-439</fpage> <ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1109/APEC.2014.6803344">https://doi.org/10.1109/APEC.2014.6803344</ext-link></mixed-citation></ref>
<ref id="ref2"><label>2</label><mixed-citation publication-type="other"><person-group person-group-type="author"><string-name>Dally, W.J. and Poulton, J.W.</string-name></person-group> (<year>1998</year>). <article-title>Digital Systems Engineering</article-title>. <source>Cambridge University Press, Cambridge</source></mixed-citation></ref>
<ref id="ref3"><label>3</label><mixed-citation publication-type="other"><person-group person-group-type="author"><string-name>Das Sharma, D., Pasdast, G., Qian, Z. and Aygun, K.</string-name></person-group> (<year>2022</year>). <article-title>Universal Chiplet Interconnect Express (UCIe): An open industry standard for innovations with chiplets at package level</article-title>. <source>IEEE Transactions on Components, Packaging and Manufacturing Technology</source>, <volume>12(9)</volume>, <fpage>1423-1431</fpage> <ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1109/TCPMT.2022.3207195">https://doi.org/10.1109/TCPMT.2022.3207195</ext-link></mixed-citation></ref>
<ref id="ref4"><label>4</label><mixed-citation publication-type="other"><person-group person-group-type="author"><string-name>IEEE</string-name></person-group> (<year>2020</year>). <article-title>IEEE Std 1838-2019: IEEE Standard for Test Access Architecture for Three-Dimensional Stacked Integrated Circuits</article-title>. <source>Institute of Electrical and Electronics Engineers, New York</source></mixed-citation></ref>
<ref id="ref5"><label>5</label><mixed-citation publication-type="other"><person-group person-group-type="author"><string-name>IEEE EPS</string-name></person-group> (<year>2019</year>). <article-title>Heterogeneous Integration Roadmap, 2019 Edition</article-title>. <source>IEEE Electronics Packaging Society, Piscataway, NJ</source></mixed-citation></ref>
<ref id="ref6"><label>6</label><mixed-citation publication-type="other"><person-group person-group-type="author"><string-name>Ingerly, D.B., Amin, S., Aryasomayajula, L., Balankutty, A., Borst, D., Chandra, A., Cheemalapati, K., Cook, C.S., Criss, R., Enamul, K. et al.</string-name></person-group> (<year>2019</year>). <article-title>Foveros: 3D integration and the use of face-to-face chip stacking for logic devices</article-title>. <source>2019 IEEE International Electron Devices Meeting (IEDM)</source> <ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1109/IEDM19573.2019.8993637">https://doi.org/10.1109/IEDM19573.2019.8993637</ext-link></mixed-citation></ref>
<ref id="ref7"><label>7</label><mixed-citation publication-type="other"><person-group person-group-type="author"><string-name>Iyer, S.S.</string-name></person-group> (<year>2016</year>). <article-title>Heterogeneous integration for performance and scaling</article-title>. <source>IEEE Transactions on Components, Packaging and Manufacturing Technology</source>, <volume>6(7)</volume>, <fpage>973-982</fpage> <ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1109/TCPMT.2015.2511626">https://doi.org/10.1109/TCPMT.2015.2511626</ext-link></mixed-citation></ref>
<ref id="ref8"><label>8</label><mixed-citation publication-type="other"><person-group person-group-type="author"><string-name>Kehlet, D.</string-name></person-group> (<year>2017</year>). <article-title>Accelerating innovation through a standard chiplet interface: The Advanced Interface Bus (AIB)</article-title>. <source>White paper, Intel Corporation, Santa Clara, CA</source></mixed-citation></ref>
<ref id="ref9"><label>9</label><mixed-citation publication-type="other"><person-group person-group-type="author"><string-name>Knickerbocker, J.U., Andry, P.S., Dang, B., Horton, R.R., Interrante, M.J., Patel, C.S., Polastre, R.J., Sakuma, K., Sirdeshmukh, R., Sprogis, E.J. et al.</string-name></person-group> (<year>2008</year>). <article-title>Three-dimensional silicon integration</article-title>. <source>IBM Journal of Research and Development</source>, <volume>52(6)</volume>, <fpage>553-569</fpage></mixed-citation></ref>
<ref id="ref10"><label>10</label><mixed-citation publication-type="other"><person-group person-group-type="author"><string-name>Lau, J.H.</string-name></person-group> (<year>2022</year>). <article-title>Recent advances and trends in advanced packaging</article-title>. <source>IEEE Transactions on Components, Packaging and Manufacturing Technology</source>, <volume>12(2)</volume>, <fpage>228-252</fpage> <ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1109/TCPMT.2022.3144461">https://doi.org/10.1109/TCPMT.2022.3144461</ext-link></mixed-citation></ref>
<ref id="ref11"><label>11</label><mixed-citation publication-type="other"><person-group person-group-type="author"><string-name>Loh, G.H., Naffziger, S. and Lepak, K.</string-name></person-group> (<year>2021</year>). <article-title>Understanding chiplets today to anticipate future integration opportunities and limits</article-title>. <source>2021 Design, Automation &amp; Test in Europe Conference &amp; Exhibition (DATE)</source>, <fpage>142-145</fpage></mixed-citation></ref>
<ref id="ref12"><label>12</label><mixed-citation publication-type="other"><person-group person-group-type="author"><string-name>Mahajan, R., Sankman, R., Patel, N., Kim, D.-W., Aygun, K., Qian, Z., Mekonnen, Y., Salama, I., Sharan, S., Iyengar, D. and Mallik, D.</string-name></person-group> (<year>2016</year>). <article-title>Embedded multi-die interconnect bridge (EMIB): A high density, high bandwidth packaging interconnect</article-title>. <source>2016 IEEE 66th Electronic Components and Technology Conference (ECTC)</source>, <fpage>557-565</fpage> <ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1109/ECTC.2016.201">https://doi.org/10.1109/ECTC.2016.201</ext-link></mixed-citation></ref>
<ref id="ref13"><label>13</label><mixed-citation publication-type="other"><person-group person-group-type="author"><string-name>Marinissen, E.J. and Zorian, Y.</string-name></person-group> (<year>2009</year>). <article-title>Testing 3D chips containing through-silicon vias</article-title>. <source>2009 International Test Conference</source> <ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1109/TEST.2009.5355573">https://doi.org/10.1109/TEST.2009.5355573</ext-link></mixed-citation></ref>
<ref id="ref14"><label>14</label><mixed-citation publication-type="other"><person-group person-group-type="author"><string-name>Moore, G.E.</string-name></person-group> (<year>1965</year>). <article-title>Cramming more components onto integrated circuits</article-title>. <source>Electronics</source>, <volume>38(8)</volume>, <fpage>114-117</fpage></mixed-citation></ref>
<ref id="ref15"><label>15</label><mixed-citation publication-type="other"><person-group person-group-type="author"><string-name>Naffziger, S., Beck, N., Burd, T., Lepak, K., Loh, G.H., Subramony, M. and White, S.</string-name></person-group> (<year>2021</year>). <article-title>Pioneering chiplet technology and design for the AMD EPYC and Ryzen processor families</article-title>. <source>2021 ACM/IEEE 48th Annual International Symposium on Computer Architecture (ISCA)</source>, <fpage>57-70</fpage> <ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1109/ISCA52012.2021.00014">https://doi.org/10.1109/ISCA52012.2021.00014</ext-link></mixed-citation></ref>
<ref id="ref16"><label>16</label><mixed-citation publication-type="other"><person-group person-group-type="author"><string-name>Stow, D., Xie, Y., Siddiqua, T. and Loh, G.H.</string-name></person-group> (<year>2017</year>). <article-title>Cost-effective design of scalable high-performance systems using active and passive interposers</article-title>. <source>2017 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)</source>, <fpage>728-735</fpage></mixed-citation></ref>
<ref id="ref17"><label>17</label><mixed-citation publication-type="other"><person-group person-group-type="author"><string-name>Swaminathan, M. and Engin, A.E.</string-name></person-group> (<year>2007</year>). <article-title>Power Integrity Modeling and Design for Semiconductors and Systems</article-title>. <source>Prentice Hall, Upper Saddle River, NJ</source></mixed-citation></ref>
<ref id="ref18"><label>18</label><mixed-citation publication-type="other"><person-group person-group-type="author"><string-name>Voldman, S.H.</string-name></person-group> (<year>2015</year>). <article-title>ESD: Circuits and Devices, 2nd edition</article-title>. <source>John Wiley &amp; Sons, Chichester</source></mixed-citation></ref>
</ref-list>
</back>
</article>